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Published October 25, 2017 | Version v1
Conference paper Open

A Probabilistic Approach for Failure Localization

  • 1. KIOS Research and Innovation Center of Excellence, University of Cyprus
  • 2. Department of Electrical Engineering, Computer Engineering, and Informatics Cyprus University of Technology

Description

This work considers the problem of fault localization
in transparent optical networks. The aim is to localize singlelink
failures by utilizing statistical machine learning techniques
trained on data that describe the network state upon current
and past failure incidents. In particular, a Gaussian Process
(GP) classifier is trained on historical data extracted from the
examined network, with the goal of modeling and predicting
the failure probability of each link therein. To limit the set of
suspect links for every failure incident, the proposed approach is
complemented with the utilization of a Graph-Based Correlation
heuristic. The proposed approach is tested on a dataset generated
for an OFDM-based optical network, demonstrating that it
achieves a high localization accuracy. The proposed scheme can
be used by service providers for reducing the Mean-Time-To-
Repair of the failure.

Notes

© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. T. Panayiotou, S. P. Chatzis and G. Ellinas, "A probabilistic approach for failure localization," 2017 International Conference on Optical Network Design and Modeling (ONDM), Budapest, 2017, pp. 1-6.

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Additional details

Funding

KIOS CoE – KIOS Research and Innovation Centre of Excellence 739551
European Commission