Ion Intercalation in Lanthanum Strontium Ferrite for Aqueous Electrochemical Energy Storage Devices

Dataset for the article: Tang et al. ACS Appl. Mater. Interfaces 2022, 14, 16, 18486–18497.

The dataset contains:

• "CV": Cycle Voltammetry of La0.5Sr0.5FeO3-δ thin films in 0.1 M KOH solution (scan rate 0.5 mV/s)..
• "Defect Model Fitting": Equilibrium concentration of oxygen vacancies, protons (OH^.), Fe⁴⁺ calculated by the defect chemistry model in LSF50 as a function of the electrochemical potential applied in the solution.
• "ex-situ_optical conductivity N2 reduced and post K": Optical conductivity vs photon energy measured in a sample reduced in N2 and the same sample after a post oxidation in KOH.
• "in situ_differential charge.rar" Differential charge measured by ellipsometry and electrochemical current during the in-situ experiments
• "in situ_optical conductivity.rar": Optical conductivity of LSF thin films vs photon energy measured after the application of the different potentials in the in-situ experiments. Potential applied are reported in the name of the txt files.
• "in-situ-exp_Optical conductivity and Fe4+ vs E app": Evolution of the optical conductivity at 2eV and calculated Fe4+ concentration vs equilibrium electrochemical potential applied in the in-situ experiments.
• "in-situ-exp_time-potential-current.txt" Current measured in the in-situ experiments after the application of electrochemical potentials as a function of time.
• "optical conductivity ex situ.rar" Ex-situ optical conductivity spectra of LSF thin films oxidized and reduced in different enviroments (N2, O2 and electrochemically in KOH).
• "PALS.rar" Average lifetime of positrons measured in Positron Annihilation Lifetime Spectroscopy for the LSF thin films oxidized and reduced in different enviroments (N2, O2 and electrochemically in KOH).
• "SIMS_Oh- and H- intensity.txt" ToF-SIMS depth profiles of H- and OH- ions intensities for the KOH-reduced sample vs sputtering time.
• "VE-PALS.rar" First, second and third component of the positron lifetime, errors and relative intensities measured by Variable Energy Positron Annihilation Lifetime Spectroscopy for the LSF thin films oxidized and reduced in different enviroments (N2, O2 and electrochemically in KOH).
• "XRD.rar" X-Ray Diffraction patterns of the LSF thin films oxidized and reduced in different enviroments (N2, O2 and electrochemically in KOH).