Contour method dataset for as-deposited and rolled wire+arc additive manufacturing Ti–6Al–4V components

This is an archive of the raw metrology of the EDM cut surface data files used for the contour method analysis of Wire+Arc Additive Manufacture (WAAM) Ti6Al4V components appearing in: "Residual stress of as-deposited and rolled wire+arc additive manufacturing Ti–6Al–4V components" by F. Martina, M. J. Roy, B. A. Szost, S. Terzi, P. A. Colegrove, S. W. Williams, P. J. Withers, J. Meyer and M. Hofmann.

The files are described by their filenames and side of each EDM cut. For example, 'Control_1.dat' refers to one side of the cut performed on the as-deposited specimen, while '50kN_1.dat' refers to one side of a specimen rolled at 50 kN load, etc.

Data is in the form of a point cloud with one point per line, whitespace delimited in microns. Data was captured with a Nanofocus CF-4 laser profilometer sensor with point spacing 30 µm apart. Data with z coordinates below or above 500 µm are considered outside of the surface detection limits.