Published September 10, 2020 | Version v1
Conference paper Open

Dataset Reduction Framework For Intelligent Fault Detection In IoT-based Cyber-Physical Systems Using Machine Learning Techniques

  • 1. KIOS Research and Innovation Center Of Excellence Department of Electrical and Computer Engineering

Description

Intelligent Fault Detection (IFD), the use of machinelearning-based methods and algorithms for the fault detectionin modern systems 4 due to the large number of data beinggenerated by devices embedded in such systems. A typicalexample of such systems is Internet of Things (IoT)-based Cyber-Physical Systems (CPS) where IoT devices are used for bettermonitoring and control of suchsystems but at the same time dueto their nature are susceptible to component faults. IFD depends on the number of data generated in such systems and their representation using system characteristics (features). Instance based dataset reduction schemes used in Machine Learning (ML)aim to reduce the volume of data required during training while maintaining or preserving testing accuracy. Such reductions lead to less storage and processing time required for the trained models, which enables the use of lightweight IFD approaches in embedded devices found in the core of IoT-based CPS systems.In this work, we propose a machine learning-based framework for instance-based dataset reduction applied for IFD models.Our proposed framework is experimentally evaluated over two datasets. Results show that reduction is possible for up to 15.51%with an average accuracy improvement of 17% on the set of evaluated classification algorithms.

Notes

© 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, in-cluding reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to serv-ers or lists, or reuse of any copyrighted component of this work in other works. G. Tertytchny and M. K. Michael, "Dataset Reduction Framework For Intelligent Fault Detection In IoT-based Cyber-Physical Systems Using Machine Learning Techniques," 2020 International Conference on Omni-layer Intelligent Systems (COINS), Barcelona, Spain, 2020, pp. 1-6, doi: 10.1109/COINS49042.2020.9191393. This work has been supported from of the Republic of Cyprus through the Directorate General for European Programmes, Coordination and Development.

Files

COINS_2020.pdf

Files (441.2 kB)

Name Size Download all
md5:126adb13d69adb0d31ea003c1ad0754a
441.2 kB Preview Download

Additional details

Funding

European Commission
KIOS CoE - KIOS Research and Innovation Centre of Excellence 739551