Published April 5, 2017
| Version 1.0
Dataset
Open
CCD Scan 8032: NiFe_8032
Description
Calibration data set measured at Beamline 4.0.2 of the Advanced Light Source (Berkeley, CA) using the resonant soft x-ray scattering endstation.
- Scan ID: 8032
- Calibration standard with 200-nm X 200-nm pitch
Files
CCD Scan 8032.zip
Files
(40.8 MB)
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