Published October 1, 2016
| Version v1
Journal article
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Monitoring texture formation during diamond growth by specular and diffuse reflectance interferometry
- 1. CEA, LIST, Diamond Sensors Laboratory, Gif-sur-Yvette Cedex 91191, France
- 2. Thales Research and Technology, Route Dèpartementale 128, Palaiseau 91767, France
- 3. Thales Electron Devices, ZI de Vongy, Thonon-les-Bains 74202, France
Description
This paper is aimed at describing a sequential synthesis coupled to an extensive analysis in order to study the morphological evolution of a {100}{111}⟨100⟩ textured diamond film. We compare several morphological parameters obtained by in situ optical methods and ex situ characterizations. The texture formation is found to be correlated with a significant increase in the growth rate of the film. In addition, morphology reconstruction of polycrystalline film is presented from which the R100 covering ratio of {100} faces is extracted. As a result, a phenomenological model has been developed for real-time growth parameters extraction of the film based on in situ optical measurements.
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