Published July 28, 2025
| Version v1
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Serial three-dimensional electron diffraction raw datasets
Description
Raw serial three-dimensional electron diffraction (3D ED) datasets acquired from enantiomerically mixed crystalline powders of tellurium. All experiments were performed on a JEOL F200 transmission electron microscope operating at 200 kV, equipped with a hybrid pixel detector (Amsterdam Scientific Instruments) for both imaging and diffraction data collection.
Files
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(3.9 GB)
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md5:205f41e6adc2e955fe836a5eaf15531b
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3.9 GB | Download |