Published April 9, 2025
| Version v2
Dataset
Open
Preventing overfitting in infrared ellipsometry using temperature dependence: fused silica as a case study: manuscript data
Creators
-
1.
University of Wisconsin–Madison
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2.
University of Wisconsin-Madison
Description
- Relevant data files for "Preventing overfitting in infrared ellipsometry using temperature dependence: fused silica as a case study"
Files
Temperature-dependent ellipsometry raw data for three grades of Corning fused silica.zip
Files
(13.0 MB)
| Name | Size | Download all |
|---|---|---|
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md5:35235232ea1775637a7e40c79e807702
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1.6 MB | Preview Download |
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md5:2da5db99368af4e52989967929e0db50
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330.8 kB | Download |
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md5:53273803032027529ca05cbbec5f2dc3
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11.0 MB | Download |
Additional details
Funding
- Office of Naval Research
- N00014-20-1-2297