Published January 31, 2025
| Version v1
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Measurements reports
Description
This report summarizes the measurement of the ASICs produced in the WP11 micro-electronics work package. The document is organized in two main parts. The first one summarizes the experimental results obtained on test structures produced in a 28 nm node. The second part describes the measurements obtained on complex ASICs optimized for different detectors and applications fabricated in a 130 nm process.
Files
AIDAinnova_D11.3.pdf
Files
(2.7 MB)
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