EXPERIMENTAL INVESTIGATION OF PLANAR MICROSTRIP RESONATOR FOR PERMITTIVITY MEASUREMENT

Characterization of dielectric material can be done by the nondestructive method of microstrip straight resonator and microstrip ring resonator sensor. To determine dielectric constant and loss tangent of solid,liquid and paste proposed measurement method is based on transmission line modeling (TLM) method in Time Domain. Dielectric constant is very much sensitive to variations in dimensions of microstrip planar structure. Straight and Ring resonators are fabricated with Glass Epoxy and RT Duroid substrate. Experimental work is carried out by measuring resonant frequency and return loss S 21 on vect or network analyzer (VNA). This study presents the determination of permittivity with variation in dimension of microstrip ring resonator and different low loss and high loss substrates. This study is helpful to specify correct dimensions of the sensor wit h the correct choice of substrate for accurate determination complex permittivity.

https://www.ijiert.org/paper-details?paper_id=141096