Published February 11, 2025 | Version 2
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Significantly overestimated mobility and other inconsistencies in A. Liu et al., Nature 629, 798 (2024)

  • 1. ROR icon Rutgers, The State University of New Jersey
  • 2. Rutgers University New Brunswick

Description

This preprint provides a critical analysis of the thin-film transistor (TFT) characteristics published in A. Liu et al., "Selenium-alloyed tellurium oxide for amorphous p-channel transistors", Nature 629, 798 (2024), revealing significant inconsistencies within the published data set, in which (parts of) the data contradict to the claimed TFT mobility, thus showing that the reported mobility appears to be significantly overestimated.  

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Created
2024-12-31