Code and Data for Transfer Learning for Multi-material Classification of Transition Metal Dichalcogenides with Atomic Force Microscopy

The data consists of atomic force microscopy (AFM) images of metal organic chemical deposition (MOCVD) grown transition metal dichalcogenides (TMDs), MoS2, WS2, WSe2, MoSe2, and Mo-WSe2, used for the results reported in the manuscript "Transfer Learning for Multi-material Classification of Transition Metal Dichalcogenides with Atomic Force Microscopy". The TMDs are grown at the Penn State's 2D crystal consortium (2DCC). The raw data is also available on the LiST (https://data.
2dccmip.org/Rut1mMC8u25M). The file names have the format: imageSNo_TMD_sampleLabel_sampleId_set.tif, where SNo, TMD, sampleLabel, sampleId, and set are serial numbers (1, 2, 3, ...), class of TMD (e.g. MoS2, WS2, ...), sample label, sample id, and train or test set, as used in the manuscript. There could be multiple images from the same samples (taken from the center, edges, etc, of wafer). Images from the same sample have the same sample label and sample id. In using the data, it is recommended that the same sample is not present in more than one data set to avoid data leakage.