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Published March 1, 2024 | Version 1
Journal article Open

Machine Learning Inspired Nanowire Classification Method based on Nanowire Array Scanning Electron Microscope Images

Authors/Creators

  • 1. IBM Research Europe - Zurich, Rüschlikon, Säumerstrasse 4, 8803, Switzerland
  • 2. James Watt School of Engineering, University of Glasgow, Glasgow, Scotland, UK

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Cites
10.1002/pssa.202370016 (DOI)
10.1109/TED.2016.2554561 (DOI)
10.1109/IITC-AMC.2016.7507651 (DOI)
10.1109/TED.2023.3242632 (DOI)
10.1109/5.867687 (DOI)
10.1063/1.5087862 (DOI)
10.1126/science.1230969 (DOI)
10.1126/sciadv.aat8896 (DOI)
10.1021/acsanm.0c02224 (DOI)
10.1109/TED.2021.3067273 (DOI)
10.1016/j.pquantelec.2019.05.002 (DOI)
10.1002/lpor.201700063 (DOI)
10.1063/1.4916984 (DOI)
10.1088/1361-6641/ac9f60 (DOI)
10.1038/s41467-022-28502-6 (DOI)
10.1088/1361-6528/aaf547 (DOI)
10.1021/acs.cgd.9b00843 (DOI)
10.1016/j.jcrysgro.2022.127015 (DOI)
10.1016/j.micron.2021.103069 (DOI)
10.1016/j.ultramic.2016.09.015 (DOI)
10.1017/S1551929500051154 (DOI)
10.1038/s41598-017-13565-z (DOI)
10.1038/s41467-021-26565-5 (DOI)
10.1063/5.0087381 (DOI)
10.1016/j.mtcomm.2021.102198 (DOI)
10.1038/s41524-022-00767-x (DOI)
10.1109/DICTA.2017.8227427 (DOI)
10.1021/acsnano.0c06809 (DOI)
10.1021/acsami.3c02448 (DOI)
10.1021/acs.cgd.3c00806 (DOI)

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