Design review of 28NM run

WP11.2 aims at investigating the use of the 28 nm CMOS node to design the next-generation ICs for particle detectors.  In this context, key properties of the technology, such as its radiation hardness, are studied with suitable test structures and IPs in large demand in radiation detection systems, such as front-end amplifiers, ADCs and TDCs are implemented to achieve faster development cycles in future projects.