Published November 26, 2023 | Version 2.0.0
Dataset Open

A simple, static and stage mounted direct electron detector based electron backscatter diffraction system

Authors/Creators

  • 1. The University of British Columbia (Vancouver)

Description

Data set for A simple, static and stage mounted direct electron detector based electron backscatter diffraction system

T.Zhang, T. B. Britton

 

Contents

- New in v2.0.0: CAD drawings of the stage

 

- Single Si(100) diffraction patterns at 4 camera lengths, and at 4 corners of the sample

- Horizontal and vertical line scan on Si(100) with 20 grid points

- 20x20 mapping scan on a polycrystalline Cu sample

Scan parameters for the line scans and map are included in logfiles within each subfolder.

 

All pattern files are provided in .h5 format and .tif format. Analyses of the patterns were performed with AstroEBSD and MTEX.

Files

Cu_patterns.zip

Files (286.3 MB)

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md5:4c3b46eb975b1c550aad11bca88b6e60
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md5:587ba50d2832daedbdc6d12916ff3e09
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md5:3fb28fef6b57ca5723692cc71ec2a49d
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Additional details

Dates

Created
2023-11-20

References

  • T.B. Britton, V.S. Tong, J. Hickey, A. Foden, A.J. Wilkinson, AstroEBSD: Exploring new space in pattern indexing with methods launched from an astronomical approach, J. Appl. Crystallogr. 51 (2018) 1525–1534. https://doi.org/10.1107/S1600576718010373.
  • F. Bachmann, R. Hielscher, H. Schaeben, Texture analysis with MTEX- Free and open source software toolbox, Solid State Phenomena. 160 (2010) 63–68.