Published August 3, 2023
| Version v1
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TA03-04: Statistical approach to defect simulation in complex analog and mixed-signal circuits: application to radiation-induced single-event transients
Authors/Creators
- 1. Instituto de Microelectrónica de Sevilla (IMSE-CNM, CSIC, Universidad de Sevilla)
Description
RADNEXT Transnational Access Summary Report