AI-Based Knowledge Management System for Risk Assessment and Root Cause Analysis in Semiconductor Industry

This paper proposes a new expert system concept for failure root cause analysis and risk assessment in the semiconductor industry, which leverages the advanced graph embeddings in combination with language models. The main challenges in this setting are the type of relations of interest, which are causal, and the language being used, which is highly domain-specific. Thus, we devised AI for consistency improvement of the data, predicting new links, and information extraction from unstructured data. The information extraction is conducted by levaraging domain specific ontologies and by focusing on presence of causal language.