Published April 6, 2023
| Version v1
Dataset
Open
IODP Expedition 396 X-ray diffraction (XRD)
Creators
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Planke, Sverre
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Berndt, Christian
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Alvarez Zarikian, Carlos A.
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Agarwal, Amar
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Andrews, Graham D.M.
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Betlem, Peter
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Bhattacharya, Joyeeta
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Brinkhuis, Henk
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Chatterjee, Sayantani
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Christopoulou, Marialena
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Clementi, Vincent J.
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Ferré, Eric C.
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Filina, Irina Y.
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Frieling, Joost
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Guo, Pengyuan
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Harper, Dustin T.
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Jones, Morgan T.
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Lambart, Sarah
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Longman, Jack
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Millett, John
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Mohn, Geoffroy
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Nakaoka, Reina
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Scherer, Reed P.
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Tegner, Christian
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Varela, Natalia
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Wang, Mengyuan
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Xu, Weimu
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Yager, Stacy L.
Contributors
Data collector:
Description
X-ray diffraction (XRD) is used to identify minerals and their proportions in sediment or hard rock sample powders on a Bruker AXS D4 Endeavor X-ray diffractometer. Results are returned as diffractograms in a viewable format (either PDF or PNG).
Files
XRD-README.txt
Additional details
Related works
- Is documented by
- 10.14379/iodp.proc.396.2023 (DOI)