Published January 9, 2023 | Version v1
Video/Audio Open

Al7075 DCB Control DIC

  • 1. University of Florida

Contributors

  • 1. University of Florida

Description

X-Strain map generated by digital image correlation for an Al7075 double cantilever beam specimen at 150 °C. Control specimen for subsequent testing with indium exposure at the notch. 

Files

Exx_Fix.gif

Files (13.0 MB)

Name Size Download all
md5:93403a52de3ceb465359de90e29ff5c6
13.0 MB Preview Download