Published July 25, 2020 | Version v1
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Statistical analysis of harmonic signals for testing of Electronic Devices

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Harmonic signals are often used for control of functional state of electronic devices. In this paper we show that the goal can be achieved via monitoring of the statistical behavior of harmonic signals propagating through the tested device. Malfunctions of the device lead to the changes in the statistical characteristics of the harmonic signals and thus are used for the monitoring of the technical state of the device. We consider statistical behavior of such signals at the variation of their phase, caused by malfunctions in electronic devices. Deviation of the mathematical expectation from its nominal values and dispersion are proposed for estimation of malfunction of a device. A functional scheme of a controller analyzing the mathematical expectation and dispersion is proposed. An experiment demonstrating how the proposed approach can be used for monitoring of the technical state of an electronic device under the influence of the external noise is presented.

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International Journal of Emerging Trends in Engineering Research (ISSN 2347-3983) Volume 8. No. 7, July 2020 pp. 3791-3798

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