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A Rescue Demonstrator for Interdependent Aspects of Reliability, Security and Quality Towards a Complete EDA Flow

Nevin George; Guilherme Cardoso Medeiros; Junchao Chen; Josie Esteban Rodriguez Conda; Thomas Lange; Aleksa Damljanovic; Raphael Segabinazzi Ferreira; Aneesh Balakrishnan; Xinhui (Anna) Lai; Shayesteh Masoumian; Dmytro Petryk; Troya Cagil Koylu; Felipe Augusto da Silva; Ahmet Cagri Bagbaba; Cemil Cem Gürsoy; Said Hamdioui; Mottaqiallah Taouil; Milos Krstic; Peter Langendoerfer; Zoya Dyka; Marcelo Brandalero; Michael Hübner; Jörg Nolte; Heinrich Theodor Vierhaus; Matteo Sonza Reord; Giovanni Squillero; Luca Sterpone; Jaan Raik; Dan Alexandrescu; Maximilien Glorieux; Georgios Selimis; Geert-Jan Schrijen; Anton Klotz; Christian Sauer; Maksim Jenihhin

The demonstrator highlights the various interdependent aspects of Reliability, Security and Quality in nanoelectronics system design within an EDA toolset and a processor architecture setup. The compelling need of attention towards these three aspects of nanoelectonic systems have been ever more pronounced over extreme miniaturization of technologies. Further, such systems have exploded in numbers with IoT devices, heavy and analogous interaction with the external physical world, complex safety-critical applications, and Artificial intelligence applications. RESCUE targets such aspects in the form, Reliability (functional safety, ageing, soft errors), Security (tamper-resistance, PUF technology, intelligent security) and Quality (novel fault models, functional test, FMEA/FMECA, verification/debug) spanning the entire hardware software system stack. The demonstrator is brought together by a group of PhD students under the banner of H2020-MSCA-ITN RESCUE EU project. They are part of a larger interdisciplinary cross-sectoral team from Tallinn UT, TU Delft, BTU Cottbus, POLITO, IHP, IROC, Intrinsic-ID, Cadence and Bosch who collaborate on a holistic solution for modelling, assessment and enhancement of these extra functional design aspects.

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