Dataset accompanying the publication "Workflow towards Automated Segmentation of Agglomerated, Non-Spherical Particles from Electron Microscopy Images using Artificial Neural Networks"
- 1. Federal Institute for Materials Research and Testing (BAM), Richard‑Willstaetter‑Strasse 11, 12489 Berlin, Germany
- 2. Federal Institute for Materials Research and Testing (BAM), Unter den Eichen 44‑46, 12203 Berlin, Germany
Description
This dataset accompanies the following publication, first published in Scientific Reports (www.nature.com/articles/s41598-021-84287-6):
B. Ruehle, J. Krumrey, V.-D. Hodoroaba, Scientific Reports, Workflow towards Automated Segmentation of Agglomerated, Non-Spherical Particles from Electron Microscopy Images using Artificial Neural Networks, DOI: 10.1038/s41598-021-84287-6
It contains electron microscopy micrographs of TiO2 particles, the corresponding segmentation masks, and their classifications into different categories depending on their visibility/occlusion. Please refer to the publication and its supporting information for more details on the acquisition and contents of the dataset, as well as the GitHub repository at https://github.com/BAMresearch/automatic-sem-image-segmentation
Files
Datasets.zip
Files
(107.6 MB)
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Additional details
Related works
- Is supplement to
- Journal article: 10.1038/s41598-021-84287-6 (DOI)