Published October 13, 2020
| Version Author Accepted Manuscript (English version)
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Modification of an SiO2(Au)/Si Surface by Irradiation with Argon Ions
Authors/Creators
- 1. Cryogenic Research Division, Scientific-Practical Materials Research Center, National Academy of Sciences of Belarus, Minsk, 220072 Belarus & Institute of Nuclear Physics,Moscow State University, Moscow, 119991 Russia
- 2. Cryogenic Research Division, Scientific-Practical Materials Research Center, National Academy of Sciences of Belarus, Minsk, 220072 Belarus
- 3. National University of Science and Technology MISIS, Moscow, 119049 Russia
- 4. Cryogenic Research Division, Scientific-Practical Materials Research Center, National Academy of Sciences of Belarus, Minsk, 220072 Belarus & South Ural State University, Chelyabinsk, 454021 Russia
- 5. Cryogenic Research Division, Scientific-Practical Materials Research Center, National Academy of Sciences of Belarus, Minsk, 220072 Belarus & Center for Quantum Technologies,Moscow State University, Moscow, 119991 Russia
- 6. Institute of Nuclear Physics,Moscow State University, Moscow, 119991 Russia
- 7. Department of Physics,Moscow State University, Moscow, 119991 Russia
- 8. Institute of Nuclear Physics,Moscow State University, Moscow, 119991 Russia & Department of Physics,Moscow State University, Moscow, 119991 Russia
Description
This article presents the results of gold deposition into pores of SiO2/Si matrices and the modifications of the obtained SiO2(Au)/Si systems by irradiation with argon Ar+ ions with an energy of 100 keV with a fluence of 5×10^14 ion/cm2. The effect of irradiation on changes in the surface topography of SiO2(Au)/Si systems and the signal intensity of surface-enhanced Raman scattering during the detection of the model analyte (methylene blue) have been shown.
Files
Bundyukova et al (AAM-EN) - Moscow University Physics Bulletin 75, 225–229 (2020).pdf
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- Journal article: 10.3103/S0027134920030078 (DOI)