Published October 1, 2009
| Version v1
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Quantum Tunneling Cantilever Deflection Metrology: A Novel Metrology for Scanning Probe Microscopy and Other Cantilever Based Devices
Creators
- 1. Interdisciplinary Centre for Mathematical and Computational Modelling, University of Warsaw
Description
This short presentation describes new designs for the AFM cantilevers that do not require optical metrology to measure bending and torsions but utilize quantum tunneling.
Notes
Quantum Tunneling Nano-Sensors
Files
Files
(1.8 MB)
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md5:44c446337d0aeccaa8db493b1597ae01
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md5:44c446337d0aeccaa8db493b1597ae01
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895.5 kB | Download |