Published March 31, 2020
| Version v2
Dataset
Open
IODP Expedition 362 X-ray diffraction (XRD)
Authors/Creators
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McNeill, L.C.
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Dugan, B.
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Petronotis, K.E.
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Backman, J.
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Bourlange, S.
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Chemale, F.
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Chen, W.
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Colson, T.A.
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Frederik, M.C.G.
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Guèrin, G.
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Hamahashi, M.
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Henstock, T.
- House, B.M.
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Hüpers, A.
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Jeppson, T.N.
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Kachovich, S.
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Kenigsberg, A.R.
- Kuranaga, M.
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Kutterolf, S.
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Milliken, K.L.
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Mitchison, F.L.
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Mukoyoshi, H.
- Nair, N.
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Owari, S.
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Pickering, K.T.
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Pouderoux, H.F.A.
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Shan, Y.
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Song, I.
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Torres, M.E.
- Vannucchi, P.
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Vrolijk, P.J.
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Yang, T.
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Zhao, X.
Contributors
Data collector:
Description
X-ray diffraction (XRD) is used to identify minerals and their proportions in sediment or hard rock sample powders on a Bruker AXS D4 Endeavor X-ray diffractometer. Results are returned as diffractograms in a viewable format (either PDF or PNG).
Updated 26 June 2020 to include additional raw data files in supplementary materials.
Files
362-XRD.zip
Files
(12.0 MB)
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Additional details
Related works
- Is documented by
- 10.14379/iodp.proc.362.2017 (DOI)