Dataset Open Access

Synchrotron Diffraction Data Recorded during High Temperature Deformation of Ti-64

Daniel, Christopher Stuart; Nguyen, Chi-Toan; Atkinson, Michael D.; Quinta da Fonseca, João

A caked synchrotron X-ray diffraction (SXRD) dataset, recording diffraction pattern rings during the high temperature deformation of a Ti-64 sample. The sample was deformed in uniaxial tension at 950°C and a strain rate of about 0.02 s-1, using an electro-thermal mechanical tester (ETMT) mounted on the I12:JEEP beamline at Diamond Light Source. Results were recorded using a high energy 89 keV synchrotron X-ray beam and a fast acquisition rate (10 Hz) detector. The results of this experiment are presented in the paper; 

Daniel, Christopher Stuart, Nguyen, Chi-Toan, Atkinson, Michael D., & Quinta da Fonseca, João. (2019, August 20). Direct Evidence for a Dynamic Phase Transformation during High Temperature Deformation in Ti-64 [Preprint]. Zenodo.

Files (518.1 MB)
Name Size
518.1 MB Download
All versions This version
Views 101101
Downloads 2525
Data volume 13.0 GB13.0 GB
Unique views 9292
Unique downloads 2222


Cite as