Published February 27, 2019
| Version v1
Dataset
Open
EDX Electron Tomography Dataset on AlSiYb-Alloy
Authors/Creators
- 1. Institute of Electron Microscopy and Nanoanalysis, Graz University of Technology, Steyrergasse 17, 8010 Graz, Austria
- 2. Institute of Electron Microscopy and Nanoanalysis, Graz University of Technology & Graz Centre for Electron Microcopy, Steyrergasse 17, 8010 Graz, Austria
Description
Sample: Al-5 wt.% Si alloy with 50 ppm Na and 6100 ppm Yb, FIB prepared
Microscope: FEI Titan3 60-300, Cs-corrected, FEI Super-X Detector
Fischione 2020 Advanced Tomography Holder
300 kV, STEM Nanoprobe, Convergence angle: 10 mrad, Camera length: 46 mm, Magnification: 160 kx
Tilt angle: -74° to 78°, 4° linear tilt step
Pixel Size: 0.760305 nm, Image Size: 276*296, Pixel time: 2ms
HAADF Data: Fischione HAADF Detector (~116-177 mrad)
EDX Data: Maps extracted with GMS 3, Kramers Background fit, Al-K, Si-K and Yb-L maps
Notes
Files
Files
(51.0 MB)
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md5:604487cd9d1fbc7614f6e46dd911ab97
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12.7 MB | Download |
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md5:f41207bbc677608acc21f85f4b17ba77
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265 Bytes | Download |
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md5:96153435b512e6279ff222424c48af3b
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12.7 MB | Download |
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md5:f41207bbc677608acc21f85f4b17ba77
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265 Bytes | Download |
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md5:2bd5b5d9017f4f6a6d59334aac1e6e59
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12.7 MB | Download |
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md5:f41207bbc677608acc21f85f4b17ba77
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265 Bytes | Download |
Additional details
References
- Huber R., Haberfehlner G., Holler M., Kothleitner G, Bredies, K., Total Generalized Variation regularization for multi-modal electron tomography, Nanoscale 2019, accepted