Published January 1, 1997
| Version v1
Journal article
Open
Total-dose and SEU characterization of 0.25 micron CMOS/SOI integrated circuit memory technologies
Authors/Creators
Description
n/a
Files
article.pdf
Files
(728.7 kB)
| Name | Size | Download all |
|---|---|---|
|
md5:28f6e3ebd6213fa7fe30e1cda706f206
|
728.7 kB | Preview Download |