Published June 3, 2015 | Version 10001523
Journal article Open

Estimating the Life-Distribution Parameters of Weibull-Life PV Systems Utilizing Non-Parametric Analysis

Authors/Creators

Description

In this paper, a model is proposed to determine the life distribution parameters of the useful life region for the PV system utilizing a combination of non-parametric and linear regression analysis for the failure data of these systems. Results showed that this method is dependable for analyzing failure time data for such reliable systems when the data is scarce.

Files

10001523.pdf

Files (209.3 kB)

Name Size Download all
md5:14f9e88315f1210744f4a86c8ca4e57d
209.3 kB Preview Download

Additional details

References

  • E. F. Hitt, Battelle and O. H. Columbus, "Total ownership cost use in management", Digital Avionics Systems Conference, Proceedings, 17th DASC. The AIAA/IEEE/SAE, Vol. 1, A32-1-5,(1998).
  • Maish A, Atcitty C., Hester D. Greenberg D., Osborn D., Collier D., (1997). Photovoltaic Reliability, Proceedings of the 26th Photovoltic Specialists Conference (PVSC) Anheim CA 1049.
  • Begovic M., Pregelj A., Rohatgi A., (2000). Four-year Performance Assessment of the 342 kW PV System at Georgia Tech, Proceedings of the 28th Photovoltic Specialists Conference (PVSC) Anchorage AL.
  • Guess, F. M., Usher, J. S., Hodgson, T. J. (1991). Estimating system and component reliabilities under partial information on cause of failure. J. Statist. Plann. Infer.29:75–85.
  • Flehinger, B. J., Reiser, B., and Yashchin, E. (1998). Survival with competing risks and masked causes of failures. Biometrika 85:151–164.
  • Basu, S., Basu, A. P., and Mukhopadhyay, C. (1999). Bayesian analysis for masked system failure data using non-identical weibull models. J. Statist. Plann. Infer. 78:255–275.
  • Chiranjit M. and Sanjib B., (2007). Bayesian Analysis of Masked Series System Lifetime Data. Communications in Statistics—Theory and Methods, 36: 329–348.
  • Charles E., (2008). An Introduction to Reliability and Maintainability Engineering,McGraw-Hill, New Delhi.
  • Elsayed A., (1996). Reliability Engineering, Addison Wesley, Massachusetts.