Published May 16, 2017
| Version v1
Conference paper
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Approaches for wafer level packaging and heterogeneous system integration for CMOS and MEMS sensors
Authors/Creators
- 1. X-FAB MEMS Foundry GmbH
- 2. Fraunhofer Institute for Electronic Nano Systems
- 3. X-Celeprint Inc.
Description
This paper describes approaches for 3D integration of CMOS and MEMS sensors. It implies methods for wafer level packaging, Through-Silicon-Vias (TSV) and novel methods for heterogeneous system integration like micro-transfer printing. These technologies are described on sensor devices.
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20170407_LTB3D-2017_X-FAB.pdf
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(187.3 kB)
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