Strong Grain Neighbour Effects in Polycrystals- Data set

3D-XRD measurements are for a commercially pure zirconium (CPZr) sample deformed in-situ to 1.2% strain.

HR-EBSD measurements are for the same deformed sample after unload.

Crystal Plasticity Finite Element (CPFE) simulation was done on the measured micro-structure and results of the NHS model are provided.

HR-EBSD and CPFE results are generated using in-house codes.

Details of the 3D-XRD codes are provided in the following link:

https://sourceforge.net/p/fable/wiki/Home/

The work and further analysis of the results are described in:

"Strong Grain Neighbour Effects in Polycrystal" Published in Nature Communications, DOI: 10.1038/s41467-017-02213-9

Other relevant papers:

Abdolvand, H., Majkut, M., Oddershede, J., Wright, J., Daymond, M. R., “Study of 3-D Stress Development in Parent and Twin Pairs of a Hexagonal Close-Packed Polycrystal: Part I- In situ Three-Dimensional X-ray Diffraction Measurement”, Acta Materialia, July 2015, Vol 93, Page 246-255.

Abdolvand, H., Majkut, M., Oddershede, J., Wright, J., Daymond, M. R., “Study of 3-D Stress Development in Parent and Twin Pairs of a Hexagonal Close-Packed Polycrystal: Part II- Crystal Plasticity Finite Element Modeling”, Acta Materialia, July 2015, Vol 93, Page 235-245.

Abdolvand, H., Majkut, M., Oddershede, J., Schmidt, S., Lienert, U., Diak, B., Withers, P. J., Daymond, M. R., “On the Deformation Twinning of MgAZ31B: a Three-Dimensional X-ray Diffraction Experiment and Crystal Plasticity Finite Element Model”, International Journal of Plasticity, July 2015, Vol 70, Page 77-97.

Gong, J., Britton, B. T., Cuddihy, M. A., Dunne, F. P. E. & Wilkinson, A. J. <a> Prismatic, <a> basal, and <c+a> slip strengths of commercially pure Zr by micro-cantilever tests. Acta Mater. 96, 249–257 (2015).

Poulsen, H. F. An introduction to three-dimensional X-ray diffraction microscopy. J. Appl. Crystallogr. 45, 1084–1097 (2012)

Wilkinson, A. J., Meaden, G. & Dingley, D. J. High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity. Ultramicroscopy 106, 307–313 (2006)