Published June 25, 2025 | Version v1
Dataset Open

Neutron-Induced Upsets and Stuck Bits on COTS Pseudo-Static RAMs

Creators

  • 1. ROR icon Universidad Complutense de Madrid
  • 2. Universidad Complutense de Madrid (UCM)

Contributors

Hosting institution:

  • 1. ROR icon ENEA Frascati Research Centre

Description

This is the raw data used for the poster presented at the NSREC2025 with the title of "Neutron-Induced Upsets and Stuck Bits on COTS Pseudo-Static RAMs".
The tests have been run at the ENEA center, Itlay. 

Each subfolder contains the data for one of the used memories.

Files

Files (241.2 kB)

Additional details

Funding

Ministry of Economy, Industry and Competitiveness
RESHYLIENCE PID2020-112916GB-I00
European Commission
RADNEXT - RADiation facility Network for the EXploration of effects for indusTry and research 101008126