A simple, static and stage mounted direct electron detector based electron backscatter diffraction system
Description
This is the complimentary dataset for "A low-cost electron backscatter diffraction system based on a Timepix3 direct electron detector".
Contents:
- Single Si(100) diffraction patterns at 4 camera lengths, and at 4 corners of the sample
- Horizontal and vertical line scan on Si(100) with 20 grid points
- 20x20 mapping scan on a polycrystalline Cu sample
Scan parameters for the line scans and map are included in logfiles within each subfolder.
All pattern files are provided in .h5 format and .tif format. Analyses of the patterns were performed with AstroEBSD and MTEX.
Files
Additional details
Dates
- Created
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2023-11-20
References
- T.B. Britton, V.S. Tong, J. Hickey, A. Foden, A.J. Wilkinson, AstroEBSD: Exploring new space in pattern indexing with methods launched from an astronomical approach, J. Appl. Crystallogr. 51 (2018) 1525–1534. https://doi.org/10.1107/S1600576718010373.
- F. Bachmann, R. Hielscher, H. Schaeben, Texture analysis with MTEX- Free and open source software toolbox, Solid State Phenomena. 160 (2010) 63–68.