Angle Dependent Spectral Reflectance Material Dataset based on 945 nm Time-of-Flight Camera Measurements

The dataset contains angle dependent spectral reflectance measurements of materials in the infrared spectrum at a wavelength of 945 nm taken by a time-of-flight camera, mounted on an adjustable angle measurement device.

Each data file is structured in columns with two parameters: reflectance (%) and incidence angle (°).

For each single material measurement a description file is attached in a separate ZIP-file.

Note: Please always use the latest version!