Noise Reduction in Actual Transient Measurement of Aircraft Lightning Testing by utilizing Component A Generator with a Semiconductor Switch

A semiconductor switch is employed in Component A
generator instead of conventional mechanical switch in
aircraft lightning actual transient test. One order of magnitude
noise reduction is observed in open circuit voltage responses.
Causes of the noises are discussed. Electro-magnetic (EM)
shielding at both ends of cables under test becomes
unnecessary in most cases for Component A measurements
with introduction of the semiconductor switch. Simple
shielding for Component H measurements is developed
considering frequency range and levels of noises associated
with the Component H responses. The semiconductor switch
of the generator shows durability through three thousand shots
of operation.