TEM Lamella preparation and investigation by Focused Ion Beam and HR-TEM - Workflow and Examples -

Analyses by transmission electron microscopy can only be performed on thin specimens transparent to the electron beam. This requires in most cases  a sample preparation prior to the specimen observation. For polymers or biological samples microtomy is frequently used, but cannot be used for hard materials like metals or hard/soft composite materials. Here the  preparation of  TEM lamellae via FIB/SEM (Focused Ion Beam/Scanning Electron Microscopy) is the method of choice. The time consuming and difficult preparation technique is able to produce stunning results.

This poster presents some of the work that was done at CF1 in 2018.