BAM reference data: SEM raw data for the Particles Size Distribution of Al-coated titania nanoparticles (JRCNM62001a and JRCNM62002a)
Authors/Creators
- 1. Federal Institute for Materials Research and Testing (BAM)
Description
The SEM images are given in the TIF format.
For further information please look at:
- Radnik, J. Kersting, R., Hagenhoff, B., Bennet, F., Ciornii, D.; Nymark, P., Grafström R. and Hodoroaba, V.- D. Nanomaterials 2021, 11, 639. https://doi.org/10.3390/nano11030639, and
- Vasile-Dan Hodoroaba. (2021). BAM reference data: EDS raw data of Al-coated titania nanoparticles (JRCNM62001a and JRCNM62002a) [Data set]. Zenodo. http://doi.org/10.5281/zenodo.4986420
- Radnik, Jörg. (2021). BAM reference data: XPS raw data of Al-coated titania nanoparticles (JRCNM62001a and JRCNM62002a) [Data set]. Nanomaterials. Zenodo. http://doi.org/10.5281/zenodo.4986068
Measurement conditions:
In the present work, a SEM of type Supra 40 (ZEISS, Oberkochen, Germany) with a Schottky field emitter and an InLens secondary electron detector was used at a 5 kV beam acceleration voltage.