Published August 24, 2020
| Version v1
Conference paper
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VNA-Based Material Characterization in THz Domain without Classic Calibration and Time-Gating
Authors/Creators
- 1. Swiss Federal Institute of Metrology (METAS), Switzerland
- 2. Swiss Federal Institute of Metrology (METAS), Bern, Switzerland
- 3. Laboratoire National de Métrologie et d'Essais (LNE), France
- 4. Czech Metrology Institute, Czech Republic
Description
A method is presented to measure materials and extract the complex permittivity without using classic VNA calibrations and time-gating. It is based on normalization to a "Thru" connection and analyzing error-terms and multiple-reflection phenomena. Measurement results (in free-space) are presented in 75-110 GHz and 500-750 GHz bands. Normalization technique can reduce the overall measurement uncertainties and simplify the material characterization process.
Notes
This work was supported by the European Metrology Programme for Innovation and Research (EMPIR), under 18SIB09-TEMMT project. EMPIR programme is co-financed by the Participating States and from the European Union's Horizon 2020 Research and Innovation Programme.
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Additional details
Related works
- Is identical to
- Conference paper: 10.1109/CPEM49742.2020.9191818 (DOI)