Published September 21, 2020 | Version v4

Characterization of descriptors in machine learning for data-based sputtering yield prediction

Authors/Creators

  • 1. National Institute for Materials Science, Japan

Description

table I-V

Files

table1.csv

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md5:6fc70ae4e2fc5e491ef0f58762d70a1f
414 Bytes Preview Download
md5:c459b1fc438cd06dcbf1a723330f452d
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md5:ff3387e76d4fa815f27f548d7554d092
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md5:e9ec91db9e7bc9c5bacfd44320cba274
260 Bytes Preview Download
md5:09a89ba354baed8646eb0607184e67aa
366 Bytes Preview Download