AEEEM-JIRA-PROMISE

A total of 22 software defect datasets with format ARFF.

AEEEM was collected by D’Ambros et al. [1], PROMISE was prepared by Jureczko and Madeyski [2], and JIRA is a new repository of highly-curated defect  datasets collected by Yatish et al. [3].

[1] M. D’Ambros, M. Lanza, and R. Robbes, “Evaluating defect prediction approaches: A benchmark and an extensive comparison,”Empirical Softw. Engg., vol. 17, no. 4-5, pp. 531–577, Aug. 2012.

[2] M. Jureczko and L. Madeyski, “Towards identifying software project clusters with regard to defect prediction,” in Proceedings of the 6th International Conference on Predictive Models in Software Engineering, ser. PROMISE ’10. New York, NY, USA: ACM, 2010, pp. 9:1–9:10.

[3] S. Yatish, J. Jiarpakdee, P. Thongtanunam, and C. Tantithamthavorn,“Mining software defects: Should we consider affected releases?” in The International Conference on Software Engineering (ICSE), 2019.