STA-Based Single Event Transient Propagation in Advanced Technology Nodes

The increasing deployment of digital systems in radiation-exposed environments has made resilience to radiation-induced faults a critical requirement for modern electronics. As integrated circuits scale into the sub-20nm regime, their susceptibility to Single-Event Transients (SETs) increases significantly, rendering accurate and scalable analysis methods essential. This work enhances Static Timing Analysis (STA) methodologies for more precise SET modelling by integrating the Composite Current Source (CCS) timing model, which improves delay accuracy by explicitly accounting for the Miller effect, allong with a full waveform propagation framework based on pi-model interconnect representations, that capture resistive shielding effects. Extensive experimental validation across multiple technology nodes demonstrates strong correlation with SPICE simulations, establishing a reliable and scalable STA-based SET analysis framework.