Published August 2026 | Version v1

LMM-assisted Subclass-Aware Zero-Shot Industrial Defect Detection

  • 1. CERTH
  • 2. ROR icon Information Technologies Institute

Description

Acknowledgment
This work has received funding from the EU’s Horizon CL4 2024 program under Grant Agreement No 101178230
(ENCIRCLE project). This paper reflects only the authors’ view and the Commission is not responsible for any use that
may be made of the information it contains.

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EUSIPCO 1.pdf

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