EBSD maps for pure Nickel obtained with the Clarity Timepix 2 detector applying energy filtering

Four .oh5 files with EBSD experimental data obtained for a pure Nickel sample. The EBSD experiments were carried out at the IMM RWTH Aachen University with a TESCAN Clara Scanning Electron Microscope and a Clarity Timepix 2 detector. Measurements were performed by Lukas Berners.

Note that two different acceleration voltages were used (20 kV and 10 kV) and an energy filter threshold (THL) was applied in two data sets, which can be distinguished in the file name. The naming of the files are as follows: sample_acceleration-voltage_energy-filter-THL-value.

File names are:
- Ni_10kv
- Ni_20kv
- Ni_20kv_THL217
- Ni_10kv_THL360

The THL calibration data is also included. Explanation can be found in: threshold_vs_intensity_NbNi42V2_cleanup.xlsx and EnergyFilteringProcedure.pptx. The THL values and corresponding voltage can be found in energiesClarity.xlsx.

The data used in this publication was managed using the framework and metadata scheme provided by project A07 within SFB1394 Structural and Chemical Atomic Complexity — From Defect Phase Diagrams to Material Properties, project ID 409476157 funded by the Deutsche Forschungsgemeinschaft (DFG).