A comparative study of properties of ZnO and CdO thin films
Authors/Creators
- 1. ,Institute of Science, Nagpur MS-440001,India , Dr. Ganpatrao Deshmukh Mahavidyalaya, Sangola, Tal-Sangola, Dist Solapur, MS-413307, India. , Vidya Pratishthans's, Arts, Science and Commerce College, Baramati MS-413 133, India.
Description
Abstract:ZnO and CdO thin films were prepared on pre-cleaned glass substrates by the chemical
bath deposition (CBD) method at 300 K. The thin films were annealed in the air for 1 hr at
annealing temperature 400˚C were subjected for structural properties investigations using X-ray
diffraction (XRD); formorphological study by means of scanning electron microscopy
(SEM);and for optical properties investigations using ultraviolet-visible–near-infrared (UV–VIS
NIR) spectroscopy. XRD results showed thatboth ZnO and CdO films exhibit crystalline nature.
SEM studies revealed the formation of nanosheets like structure forZnO and sunflower like
structure for CdO thin film. Electrical resistivity measurement at 300 K showed that the
electrical resistivity of both oxides thin films were of the order of 1012Ω.cm was found to
decrease with a temperature rise, indicating the normal semiconductor behavior. Furthermore,
the optical investigationsincludingband gap energy, extinction coefficient, refractive index and
optical conductivity etc, have been investigated and compared with each other. The direct band
gap energy values were observed 3.7 eV and 2.7 eV for ZnO and CdO thin film, respectively.
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