Published January 21, 2026
| Version v1
Dataset
Open
Dataset of Analysis of Cu-Associated Defects in Silicon through Lifetime Spectroscopy
Authors/Creators
-
1.
Universidad Politécnica de Madrid
Description
This dataset contains the experimental data presented in the poster ''"Analysis of Cu-Associated Defects in Silicon through Lifetime Spectroscopy", which was showed at EUPVSEC25 (42nd European Photovoltaic Solar Energy Conference and Exhibition).
The data were collected and processed using Origin, including measurements relevant for detection of Cu-associated defects in silicon.
Files
Files
(2.2 MB)
| Name | Size | Download all |
|---|---|---|
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md5:8d51fbfa34a8a42738b5a3e0a167100c
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2.2 MB | Download |
Additional details
Related works
- Is supplement to
- Poster: 978-3-936338-93-5 (ISBN)