On-wafer microwave metrology for future industrial applications
Published May 21, 2025 | Version v1
Poster Open

Quantum Metrology for High Frequency Electric Fields

Authors/Creators

  • 1. ROR icon Swiss Federal Institute of Metrology
  • 2. ROR icon University of Basel

Description

We investigate the use of alkali atoms as electric field sensors for high frequency on wafer measurements These atoms are well defined quantum systems and hold a promising potential for accurate and traceable measurements The project aims to map electric fields above a coplanar waveguide and to determine microwave power and S Parameters up to 50 GHz.

Notes

The project (23IND10 OnMicro) has received funding from the European Partnership on Metrology, co-financed from the European Union’s Horizon Europe Research and Innovation Programme and by the Participating States. 

  • Funder name: European Partnership on Metrology
  • Funder ID: 10.13039/100019599
  • Grant number: Partnership 23IND10 OnMicro

Files

Rydberg_BIPM150yrs_v3.pdf

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Additional details

Funding

European Association of National Metrology Institutes
On-wafer microwave metrology for future industrial applications 23IND10