XRM2024 - Mon03K - "Synchrotron X-ray beam motion by electron source position scanning"

High-resolution X-ray imaging is often performed by scanning a probe over a field of view, as for example in nanoprobe X-ray fluorescence microscopy or ptychography. These approaches rely on scanning instrumentation and algorithmic approaches to achieve optimal spatial resolution. Whilst high-performance stages, interferometric systems and the design of advanced instrumentation go some way to provide the desired speed, accuracy, precision and stability, the mechanical performance of these systems remains a limiting factor.

This work describes a new approach for synchrotron X-ray beam scanning without any mechanical motion. Instead, the X-ray beam at the sample plane is scanned by the motion of the X-ray source position within the insertion device, eliminating all mechanical motion. This approach was first proposed in 2014 by de Jonge et al. [1]. However, until now the range of electron beam motion thought necessary was deemed impractical, and a demonstration was never realised. Here, we revisit this idea, reposing the concept for a configuration that employs low source-demagnification optics to help limit the required source movement for probe translation. Source Position Scanning (SPS) is demonstrated for ptychographic data collection and foreseen to be applicable to other synchrotron imaging methods. The use of electromagnetic optics for beam scanning opens new opportunities for use within instrumentation where scanning stages may not be practical, e.g. furnaces or mK fridges, and possibilities to develop ultra-fast scanning akin to the kilohertz scanning speeds possible in today’s electron microscopes.