Full Crystallographic Imaging of Hexagonal Boron Nitride Monolayers with Phonon-Enhanced Sum-Frequency Microscopy - Experimental Data
Description
This is a data repository for the publication
Full Crystallographic Imaging of Hexagonal Boron Nitride Monolayers
with Phonon-Enhanced Sum-Frequency Microscopy
Niclas S. Mueller, Alexander P. Fellows, Ben John, Andrew E. Naclerio, Christian Carbogno,
Katayoun Gharagozloo-Hubmann, Damián Baláž, Ryan A. Kowalski, Hendrik H. Heenen, Christoph
Scheurer, Karsten Reuter, Joshua D. Caldwell, Martin Wolf, Piran R. Kidambi, Martin Thämer,
Alexander Paarmann
published in Advanced Materials
DOI: https://doi.org/10.1002/adma.202510124
It contains the data of all main figures. The repository is organized into subfolders
named after the labels of the figures. The content is described by the captions of the
figures in the manuscript.
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Data Repository.zip
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(69.2 MB)
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Related works
- Is supplement to
- Publication: 10.1002/adma.202510124 (DOI)