Published October 10, 2025 | Version Version 1
Dataset Open

Scanning Electron Microscopy (SEM) Dataset of Additively Manufactured Ni-WC Metal Matrix Composites for Semantic Segmentation

  • 1. ROR icon McGill University

Description

This dataset accompanies the publication “Accelerated quantification of reinforcement degradation in additively manufactured Ni-WC metal matrix composites via SEM and vision transformers.” It contains scanning electron microscopy (SEM) images and corresponding pixel-level segmentation masks used to train, validate, and test deep learning models for microstructural analysis.

The images represent metallographic cross-sections of directed energy deposited (DED) nickel-tungsten carbide (Ni-WC) metal matrix composites (MMCs), prepared through a detailed process involving sectioning, polishing, and etching. Each SEM image highlights key microstructural constituents — matrix, carbide particles, dilution bands, and reprecipitated carbides — with the latter two representing degradation features of reinforcement particles under elevated thermal conditions.

The dataset includes:

  • AugmentedImages.zip: 405 SEM image crops (512×512 pixels each) obtained from four magnification levels (1000×, 800×, 700×, 600×) and augmented via flips, rotations, elastic transforms, grid distortions, and controlled contrast/brightness variations.

  • AugmentedMasks.zip: Corresponding manually labeled segmentation masks, generated using the Supervisely interface with pixel-level accuracy and verified for class consistency.

The data were generated and augmented using the Albumentations library to enhance generalization and support high-throughput segmentation studies. The dataset enables benchmarking and comparison of convolutional (e.g., DeepLabV3+) and transformer-based architectures (e.g., SegFormer, UPerNet, Mask2Former, etc.) for microstructure segmentation in additive manufacturing contexts.

Applications:

  • Training and evaluation of semantic segmentation models for materials characterization

  • Quantification of carbide degradation and process-induced defects in Ni-WC MMCs

  • Benchmarking of vision transformer architectures on SEM datasets

File format:

  • Images: .bmp

  • Masks: .bmp

  • Resolution: 512×512 pixels

Acknowledgment:
If you use this dataset, please cite the associated article and acknowledge the dataset authors.

Files

AugmentedImages.zip

Files (134.0 MB)

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md5:34a1aae8215d2f04ad6334824aae64c2
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md5:1d4f32dc996cdc00009c4e8c8d88592e
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Additional details

Related works

Is supplement to
Journal: 10.1016/j.matchar.2025.115645 (DOI)