Published September 25, 2025 | Version v0.2.0
Software Open

2DIO: EuroSys 2026 Artifact

Authors/Creators

  • 1. ROR icon Northeastern University

Description

Artifact for 2DIO trace-gen package, available at: GitHub

Files

trace-gen-v0.2.0.zip

Files (32.2 kB)

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Additional details

Related works

Is supplement to
Conference paper: 10.1145/3767295.3769391 (DOI)

Software

References

  • Yirong Wang, Isaac Khor, and Peter Desnoyers. 2026. 2DIO: Configurable and Cache-Accurate Trace Generation for Storage Benchmarking. In European Conference on Computer Systems (EUROSYS '26), April 27–30, 2026, Edinburgh, Scotland Uk. ACM, New York, NY, USA, 16 pages. https://doi.org/10.1145/3767295.3769391